Three dimensional CT data processing for inspection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3586, Issue , 1999, Pages 98-109

  Wang, Wenjian ^a   Han, Lan ^a   Wu, Xiaogu ^a   Wee, William G ^a  

^a UNIVERSITY OF CINCINNATI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA PROCESSING; EDGE DETECTION; IMAGING TECHNIQUES; INSPECTION; REGRESSION ANALYSIS; WAVELET TRANSFORMS;

FACET MODELS; SURFACE DETECTION;

COMPUTERIZED TOMOGRAPHY;

EID: 0032648583     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)