Characterization of boron-doped tin oxide thin films

Thin Solid Films

Volumn 342, Issue 1, 1999, Pages 47-51

  Nasser, Seif A ^a  

^a Beni Suef University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; ENERGY GAP; POLYCRYSTALLINE MATERIALS; PYROLYSIS; SEMICONDUCTING BORON; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DOPING; THIN FILMS;

OPTICAL ENERGY GAP; SPRAY PYROLYSIS;

SEMICONDUCTING FILMS;

EID: 0032648104     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01337-6     Document Type: Article

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