Ruling of an echelle grating

American Laboratory

Volumn 31, Issue 2, 1999, Pages 14-16

  Krupa, Robert J ^a   Pereira, Eugene R ^a  

^a Thermo Jarrell Ash Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUTOMATION; CHARGE TRANSFER DEVICES; COATINGS; COMPUTER CONTROL; COMPUTER SOFTWARE; DIAMONDS; INTERFEROMETERS; LIGHT SCATTERING; OPTICAL MICROSCOPY; SPECTROMETERS; WEAR OF MATERIALS;

CHARGE INJECTION DEVICE; CHARGE TRANSFER ARRAY DETECTOR; ECHELLE GRATING; GRATING REPLICATION;

DIFFRACTION GRATINGS;

EID: 0032647570     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (0)