Effects of thermal stress on low-temperature-grown GaAs and Al0.3Ga0.7As MISFET parameters

Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

Volumn , Issue , 1999, Pages 314-317

  Rao, Rapeta V V V J ^a   Chong, T C ^a   Tan, L S ^a   Lau, W S ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; THERMAL EFFECTS; THERMAL STRESS;

PINCH OFF VOLTAGE;

MISFET DEVICES;

EID: 0032646845     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)