Comparison of optical analysis methods for oxide-apertured VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3625, Issue , 1999, Pages 359-370

  Noble, Michael J ^a   Loehr, John P ^a   Lott, James A ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; ELECTROMAGNETIC WAVE DIFFRACTION; FINITE ELEMENT METHOD;

VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0032646455     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.356895     Document Type: Conference Paper

References (21)