Superconducting electrometer based on the resistively shunted bloch transistor

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3664-3667

  Lotkhov, S V ^a   Zangerle, H ^a   Zarin, A B ^a   Weimann, T ^a   Scherer, H ^a   Niemeyer, J ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC VARIABLES CONTROL; GATES (TRANSISTOR); JOSEPHSON JUNCTION DEVICES; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING DEVICES; TUNNEL JUNCTIONS;

CAPACITIVELY COUPLED GATE; ELECTROMAGNETIC ENVIRONMENT THEORY; JOSEPHSON TO CHARGING ENERGY RATIO; RESISTIVELY SHUNTED BLOCH TRANSISTOR; STRONG NOISE LIMITS;

ELECTROMETERS;

EID: 0032645890     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783823     Document Type: Article

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