Electrostriction measurements on low permittivity dielectric materials

Journal of the European Ceramic Society

Volumn 19, Issue 6-7, 1999, Pages 1269-1273

  Yimnirun, Rattikorn ^a   Eury, Sylvie M L ^a   Sundar, V ^a   Moses, Paul J ^a   Jang, Sei Joo ^a   Newnham, Robert E ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Dielectric properties.; Electrostriction

Indexed keywords

CAPACITANCE; ELECTRIC VARIABLES MEASUREMENT; ELECTROSTRICTION; FERROELECTRIC MATERIALS; INTERFEROMETERS; MAXWELL EQUATIONS; ORGANIC POLYMERS; PERMITTIVITY;

COMPRESOMETER; ELECTROSTRICTION COEFFICIENT; ELECTROSTRICTIVE EFFECTS;

DIELECTRIC MATERIALS;

EID: 0032643828     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00418-x     Document Type: Article

References (5)

1. Sundar, V. and Newnham, R. E., Materials Research Bulletin, 1996, 31(5), 545.
2. Sundar, V. and Newnham, R. E., Journal of Materials Science Letters, 1994, 13, 799.
3. Sundar, V., Li, J.-F., Viehland, D. and Newnham, R. E., Materials Research Bulletin, 1996, 31(5), 555.
4. Newnham, R. E., Sundar, V., Yimnirun, R., Su, J. and Zhang, Q. M., Journal of Physical Chemistry B, 1997, 101(48), 10141.
5. Li, J.-F., Moses, P. J. and Viehland, D., Review of Scientific Instruments, 1995, 66(1), 215.