Enhanced selectivity and sensitivity in UV-analysis of volatile organic compounds

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3533, Issue , 1999, Pages 222-233

  Sassenscheid, K ^a   Klocke, U ^a   Schmidtke, G ^a   Tacke, M ^a  

^a FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; MONOCHROMATORS; OZONE; ULTRAVIOLET SPECTROSCOPY;

DYNAMIC DERIVATIVE SPECTROSCOPY; ENHANCED SELECTIVITY; MULTICOMPONENT GAS ANALYSIS; WASTE INCINERATION PLANT; WAVELENGTH MODULATION;

VOLATILE ORGANIC COMPOUNDS;

EID: 0032643645     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)