Raman scattering and room-temperature visible photoluminescence from Si nanocrystals embedded in SiO2 thin films

Surface and Interface Analysis

Volumn 28, Issue 1, 1999, Pages 204-207

  Wang, Yinyue ^a   Gong, Hengxiang ^a   Yang, Yinhu ^a   Guo, Yongping ^a   Gan, Runjin ^a  

^a LANZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY MEASUREMENT; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; RAMAN SCATTERING; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON COMPOUNDS; SILICA; THIN FILMS;

SILICON NANOCRYSTALS;

SEMICONDUCTING SILICON;

EID: 0032643457     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199908)28:1<204::AID-SIA608>3.0.CO;2-O     Document Type: Article

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