Digital BIST for operational amplifiers embedded in mixed-signal circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 304-310

  Rayane, I ^a   Velasco Medina, J ^a   Nicolaidis, M ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPARATOR CIRCUITS; COMPUTER SIMULATION; DELAY CIRCUITS; DIGITAL CIRCUITS; LOGIC GATES; MATHEMATICAL MODELS; MIXER CIRCUITS; OPERATIONAL AMPLIFIERS;

MIXED SIGNAL CIRCUITS; SIGNAL PROPAGATION DELAY; SLEW RATE; VOLTAGE FOLLOWER;

INTEGRATED CIRCUIT TESTING;

EID: 0032642715     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)