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Volumn 19, Issue 6-7, 1999, Pages 1391-1395

Influence of crystallization kinetics on texture of sol-gel PZT and BST thin films

Author keywords

Films; Optical microscopy; PZT.; Sol gel processes; X ray methods

Indexed keywords

CRYSTALLIZATION; LIGHT SCATTERING; MORPHOLOGY; PHASE TRANSITIONS; RAPID THERMAL ANNEALING; REACTION KINETICS; SOL-GELS; TEXTURES; THIN FILMS; TITANIUM OXIDES; X RAY CRYSTALLOGRAPHY;

EID: 0032642682     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00443-9     Document Type: Article
Times cited : (15)

References (16)
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  • 2
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    • Trolier-McKinstry S., Chen J., Vedam K., Newnham R.E. In-situ annealing studies of sol-gel ferroelectric thin films by spectroscopic ellipsometry. J. Amer. Ceram. Soc. 78:1995;1907-1913.
    • (1995) J. Amer. Ceram. Soc. , vol.78 , pp. 1907-1913
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.