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Volumn 61-62, Issue , 1999, Pages 221-224

Reflection and transmission X-ray topographic study of a SiC crystal and epitaxial wafer

Author keywords

Dislocation; Hollow core; SiC; X ray topography

Indexed keywords

BURGERS VECTOR; X RAY TOPOGRAPHY;

EID: 0032642676     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00506-6     Document Type: Article
Times cited : (10)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.