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Volumn 3, Issue , 1999, Pages 2067-2075
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High energy X-ray microscope for the local structural characterization of bulk materials
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION;
OPTICS;
SYNCHROTRON RADIATION;
THREE DIMENSIONAL;
BULK MATERIALS;
INCIDENT BEAM;
X RAY MICROSCOPES;
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EID: 0032642228
PISSN: 02734508
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (9)
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References (10)
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