Imaging energy analyzer for RHEED: Energy filtered diffraction patterns and in situ electron energy loss spectroscopy

Journal of Crystal Growth

Volumn 201, Issue , 1999, Pages 45-49

  Staib, P ^a   Tappe, W ^a   Contour, J P ^b  

^a Staib Instrumente GmbH   (Germany)

^b THALES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LOSS SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SUBSTRATES; SURFACE STRUCTURE;

DIFFRACTION PATTERNS; ELECTRON ENERGY DISTRIBUTION; IMAGING ENERGY ANALYZERS;

REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

EID: 0032641857     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)01274-3     Document Type: Article

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