The efficiency of methods for measuring A/D converter linearity

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 3, 1999, Pages 763-769

  Capofreddi, Peter D ^a,b,c   Wooley, Bruce A ^a,b  

^a IEEE   (United States)

^b STANFORD UNIVERSITY   (United States)

^c Hughes Aircraft Co   (United States)

Author keywords

Analog digital conversion; Estimation; Integrated circuit; Measurement; Nonlinearities; Testing

Indexed keywords

COMPUTER SIMULATION; ELECTRONIC EQUIPMENT TESTING; ESTIMATION; LINEAR INTEGRATED CIRCUITS; LINEARIZATION; SPURIOUS SIGNAL NOISE;

CODE DENSITY METHOD; CRAMER-RAO BOUND; DIFFERENTIAL NONLINEARITY; INTEGRAL NONLINEARITY; NONLINEARITIES; TWO OPEN LOOP MEASUREMENT METHODS;

ANALOG TO DIGITAL CONVERSION;

EID: 0032641707     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.772218     Document Type: Article

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