Vacuum shear force microscopy application to high resolution work

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 38, Issue 7 B, 1999, Pages

  Polonski, Vitali V ^a   Yamamoto, Yoh ^a   White, Jonathon D ^a   Kourogi, Motonobu ^a   Ohtsu, Motoichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; VACUUM APPLICATIONS;

MICROTUBULES; NEAR-FIELD OPTICS; VACUUM SHEAR-FORCE MICROSCOPY (VSFM);

MICROSCOPIC EXAMINATION;

EID: 0032641336     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l826     Document Type: Article

References (0)