Buffer layers and thallination of Tl-based superconductors on flexible metal substrates

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 2, 1999, Pages 1673-1676

  Parilla, P A ^a,b   Carlson, C M ^a,b   Wang, Y T ^a,b   Bhattacharya, R N ^a,b   Blaugher, R D ^a,b   Ginley, D S ^a,b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; CHARACTERIZATION; CRYSTAL LATTICES; DEPOSITION; LANTHANUM COMPOUNDS; MULTILAYERS; PRESSURE EFFECTS; STRONTIUM COMPOUNDS; THALLIUM; THERMAL EFFECTS; X RAY DIFFRACTION;

BUFFER LAYERS; CERIUM OXIDE; CHEMICAL STABILITY; FLEXIBLE METAL SUBSTRATES; LANTHANUM ALUMINATE; LANTHANUM NICKEL OXIDE; LATTICE MATCH; STRONTIUM TITANATE; THALLINATION; THALLIUM BASED SUPERCONDUCTORS;

SUPERCONDUCTING FILMS;

EID: 0032641271     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784773     Document Type: Article

References (16)

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