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Volumn 17, Issue 6, 1999, Pages 1067-1071

Estimation of system reliability for uncooled optical transmitters using system reliability function

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; FUNCTIONS; INTEGRATED CIRCUITS; PHOTODIODES; PROBABILITY; RELIABILITY; SEMICONDUCTOR LASERS; TRANSMITTERS;

EID: 0032641073     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.769309     Document Type: Article
Times cited : (10)

References (15)
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    • Vacancy-controlled model of degradation in InGaAs/AlGaAs/GaAs heterostructure lasers,"
    • A. A. Hopgood, "Vacancy-controlled model of degradation in InGaAs/AlGaAs/GaAs heterostructure lasers," J. Appl. Phys., vol. 76, pp. 4068-4071, 1994.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.