Atomic structure and properties of extended defects in silicon

Solid State Phenomena

Volumn 67, Issue , 1999, Pages 3-14

  Chisholm, M F ^a   Buczko, R ^a,b   Mostoller, M ^a   Kaplan, T ^a   Maiti, A ^a,b   Pantelides, S T ^a,b   Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; ELECTRONIC STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY;

Z-CONTRAST TECHNIQUE;

SEMICONDUCTING SILICON;

EID: 0032640332     PISSN: 10120394     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/ssp.67-68.3     Document Type: Article

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