The importance of self-consistency in determining interface properties of SIN and DIN structures

Superlattices and Microstructures

Volumn 25, Issue 5-6, 1999, Pages 1019-1031

  Martin, A M ^a   Annett, James F ^b  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

D wave; Interfaces; Order parameter; Recursion method; Self consistency; Superconductivity

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); INTERFACES (MATERIALS);

BOGOLIUBOV-DE GENNES EQUATION; RECURSION METHODS;

SUPERCONDUCTING MATERIALS;

EID: 0032640097     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1999.0709     Document Type: Article

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