High density matched hexagonal transistor structure in standard CMOS technology for high speed applications

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 212-215

  Van den Bosch, A ^a   Steyaert, M ^a   Sansen, W ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; STANDARDS;

HIGH DENSITY MATCHED HEXAGONAL TRANSISTOR STRUCTURES;

TRANSISTORS;

EID: 0032639904     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)