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Volumn 62, Issue 1, 1999, Pages 95-109

Failure assessment diagrams for high temperature defect assessment

Author keywords

Crack growth; Creep; Creep fatigue; Failure assessment diagram

Indexed keywords

CRACK PROPAGATION; CREEP; FAILURE ANALYSIS; FATIGUE OF MATERIALS; HIGH TEMPERATURE EFFECTS;

EID: 0032639774     PISSN: 00137944     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0013-7944(98)00087-3     Document Type: Article
Times cited : (66)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.