Novel Bayesian method for fitting parametric and non-parametric models to noisy data

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2, Issue , 1999, Pages 552-558

  Werman, Michael ^a   Keren, Daniel ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ERROR STATISTICS; SPURIOUS SIGNAL NOISE;

BAYESIAN METHODS; MEAN SQUARE ERROR (MSE); NOISY DATA;

PATTERN RECOGNITION;

EID: 0032639747     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (20)