Evaluation of test methods and associated test structures for interconnect reliability control

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 167-172

  Foley, S ^a   Molyneaux, J ^a   Mathewson, A ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY; SILICON WAFERS;

INTERCONNECT RELIABILITY CONTROL; MEDIAN TIME TO FAILURE (MTF) RESULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0032639658     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)