Growth and characterization of CuxAg1-xInSe2 thin films by pulsed laser deposition

Diffusion and Defect Data Pt.B: Solid State Phenomena

Volumn 67, Issue , 1999, Pages 361-366

  Gremenok, V F ^a   Bodnar, I V ^b   Martil, I ^c   Martines, F L ^c   Sergeev Nekrasov, S L ^b   Victorov, I A ^a  

^a INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^b BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^c UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; DEPOSITION; FILM GROWTH; GLASS; LASER ABLATION; POLYCRYSTALLINE MATERIALS; PULSED LASER APPLICATIONS; REFRACTIVE INDEX; SEMICONDUCTING INDIUM COMPOUNDS; STOICHIOMETRY; THIN FILMS; TRANSPARENCY;

COPPER SILVER INDIUM SELENIDE; PULSED LASER DEPOSITION;

SEMICONDUCTING FILMS;

EID: 0032639257     PISSN: 10120394     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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