Measurement of scatter from PSL standard spheres deposited on disk surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3619, Issue , 1999, Pages 72-79

  Scheer, Craig A ^a   Stover, John C ^a  

^a ADE Optical Systems   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; LATEXES; LIGHT SCATTERING; PARTICLE SIZE ANALYSIS; POLYSTYRENES; TEXTURES;

COMPUTER DISK INDUSTRY;

SEMICONDUCTOR STORAGE;

EID: 0032639060     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)