Systematic approach to reduce macroscopic defects in c-axis oriented YBCO films

Physica C: Superconductivity and its Applications

Volumn 315, Issue 1, 1999, Pages 99-106

  Krupke, R ^a   Barkay, Z ^a   Deutscher, G ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; PHASE DIAGRAMS; PRESSURE EFFECTS; SPUTTER DEPOSITION; SUBSTRATES; YTTRIUM BARIUM COPPER OXIDES;

MACROSCOPIC DEFECTS; PRESSURE CONTROLLED SELF-TEMPLATE (PST) PROCESSES;

SUPERCONDUCTING FILMS;

EID: 0032638117     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(99)00199-9     Document Type: Article

References (25)

1. Wu M.K., Ashburn J.R., Torug C.J., Hor P.H., Meng R.L., Gao L., Huang Z.J., Wang Y.Q., Chu C.W. Phys. Rev. Lett. 58:1987;908.
2. Selinder T.I., Helmersson U., Han Z., Sundgren J.-E., Sjöström H., Wallenberg L.R. Physica C. 202:1992;69.
3. Chang C.C., Wu X.D., Ramesh R., Xi X.X., Ravi T.S., Venkatesan T., Hwang D.M., Muenchausen R.E., Foltyn S., Nogar N.S. Appl. Phys. Lett. 57:1990;1814.
4. Johnson C.N.L., Helmersson U., Madsen L.D., Rudner S., Wernlund L.-D. J. Appl. Phys. 77:1995;6388.
5. Li Y.Q., Zhao J., Chern C.S., Lu P., Gallois B., Norris P., Kear B., Cosandey F. Physica C. 195:1992;161.
6. Han Z., Selinder T.I., Helmersson U. J. Appl. Phys. 75:1994;2020.
7. Krupke R., Barkay Z., Deutscher G. Physica C. 289:1997;146-150.
8. Eom C.B., Sun J.Z., Yamamoto K., Marshall A.F., Luther K.E., Geballe T.H. Appl. Phys. Lett. 55:1989;595.
9. Geerk J., Linker G., Meyer O. Mater. Sci. Rep. 4:1989;193.
10. Mahajan S., Wen J.G., Ito W., Cho C.H., Takenaka T., Kubota N., Yoshida Y., Morishita T. Physica C. 225:1994;353.
11. Lecœr Ph., Mercey B., Murray H. J. Appl. Phys. 78:1995;1247.
12. Kaufmann F., Kelso J.R. Chem. Phys. 32:1960;301.
13. Costa M.D., Zuliani P.A., Deckers J.M. Can. J. Chem. 57:1979;568.
14. Gavaler J.R., Talvacchio J., Braggins T.T., Forrester M.G., Greggi J. J. Appl. Phys. 70:1991;8.
15. Anderson G.S., Mayer Wm.N., Wehner G.K. J. Appl. Phys. 33:1962;2991.
16. Cava R.J., Batlogg B., Chen C.H., Rietman E.A., Zahurak S.M., Werder D. Phys. Rev. B. 36:1987;5719.
17. Goldstein et al., Scanning Electron Microscopy and X-ray Microanalysis, Plenum, 1992.
18. Jorgensen J.D., Veal B.W., Paulikas A.P., Nowicki L.J., Crabtree G.W., Claus H., Kwok W.K. Phys. Rev. B. 41:1990;1863.
19. Linker G., Geerk J., Kröner T., Meyer O., Remmel J., Smithey R., Strehlau B., Xi X.X. Nucl. Instrum. und Meth. B. 59-60:1991;1458.
20. Schneider R., Geerk J., Linker G., Meyer O., Smithey R. Physica C. 220:1994;165-171.
21. Krupke R., Ulmer G., Schneider R., Kurzmeier M., Linker G., Geerk J. Physica C. 279:1997;153.
22. Shapovalov A.P., Boguslavskij Y.M., Ruban A.I., Gridneva G.G., Melnikov V.S., Psentshov N.P. Supercond. Sci. Technol. 5:1992;238.
23. Aswal D.K., Gupta S.K., Narang S.N., Sabharwal S.C., Gupta M.K. Thin Solid Films. 292:1997;277.
24. Tazoh Y., Miyazawa S. Appl. Phys. Lett. 62:1993;408.
25. Lindemer T.B., Washburn F.A., MacDougall C.S., Feenstra R., Cavin O.B. Physica C. 178:1991;93.