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Volumn , Issue , 1999, Pages 121-124
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Extraction of the trap density at the gate periphery using the gated diode array for Giga-bit DRAMs
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
DYNAMIC RANDOM ACCESS STORAGE;
ELECTRIC CURRENT MEASUREMENT;
LEAKAGE CURRENTS;
GATED DIODE ARRAYS;
SEMICONDUCTOR DIODES;
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EID: 0032637992
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (4)
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References (3)
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