Theoretical basis and experimental confirmation: Why a CMOS imager is superior to a CCD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3698, Issue , 1999, Pages 388-396

  Kozlowski, L J ^a   Standley, D ^a   Luo, J ^a   Tomasini, A ^a   Gallagher, A ^a   Mann, R ^a   Hsieh, B C ^a   Liu, T ^a   Kleinhans, W E ^a  

^a ROCKWELL SCIENCE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; OBSOLESCENCE; OPTICAL RESOLVING POWER; PHOTODETECTORS; PHOTOSENSITIVITY;

ACTIVE PIXEL SENSORS; CAPACITIVE TRANSIMPEDANCE AMPLIFIERS (CTIA); FOCAL PLANE ARRAYS (FPA);

INFRARED IMAGING;

EID: 0032637827     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.354540     Document Type: Conference Paper

References (7)