Index of refraction and its temperature dependence of calcium fluoride near 157 nm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3679, Issue II, 1999, Pages 1146-1152

  Burnett, John H ^a   Gupta, Rajeev ^a   Griesmann, Ulf ^a   Jou, Ted E ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; ELECTROMAGNETIC DISPERSION; EXCIMER LASERS; GONIOMETERS; LIGHT EMISSION; OPTICAL INSTRUMENT LENSES; PRISMS; REFRACTIVE INDEX; THERMAL EFFECTS;

MINIMUM DEVIATION METHODS;

PHOTOLITHOGRAPHY;

EID: 0032637557     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.354324     Document Type: Conference Paper

References (10)