Critical current variation and current transfer length in multifilamentary Bi-2223/Ag tapes

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 2, 1999, Pages 2340-2342

  Kasztlcr, Andrea ^a   Foitl, Michael ^a   Kirchmayr, Hans ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTRIC CURRENT MEASUREMENT; MAGNETIC TAPE; SILVER;

CURRENT TRANSFER VOLTAGES; DEFECT VOLTAGES;

SUPERCONDUCTING MATERIALS;

EID: 0032637335     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784940     Document Type: Article

References (5)

1. M. Polak et al., Current transfer length and the origin of linear components in the voltage-current curves of Agsheathed BSCCO components Supercond. Sei. Technol.,vo\. lOp.l, 1997
2. M. Polak et al. Filament bridging and critical current density variation in the cross-section of multifilamentary Bi-2223/Ag tapes to be published in this journal
3. S. P. Ashworth, B. A. Glowacki, M. Ciszek, E. C. L. Chesneau, P. Haldar Connectivity between filaments in BSCCO-2223 multi-filamentary tape IEEE Tram. Appl. Super conduct., vol. 7 p. 1662, June 1997
4. M. Polak, J. A. Parrell, A. A. Polyanskii, A. E. Pashitski and D. C. Larbalestier On the role of pre-existing, unhealed cracks on the bending strain response of Ag-clad (Bi,Pb)2Sr2Ca2Cu3Ox tapes Appl. Phys. Lett., vol. 70 p. 1034, Febr. 1997
5. T. Kiss, T. Nakamura, K.. Kuroda, M. Takeo, F. Irie, K. Yamauji Pin fluctuation and the scaling of transport characteristics in superconductors Proceedings of the 21st conference on Low Temperature Physics Prague, part S3, August 1996