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Volumn 32, Issue 15, 1999, Pages 1928-1933

Vapour growth and characterization of HgBr2 crystals using confocal laser scanning microscopy, optical spectroscopy and DC conductivity measurements

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL IMPURITIES; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON ENERGY LEVELS; ENERGY GAP; OPTICAL MICROSCOPY; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; SPECTROSCOPY;

EID: 0032637085     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/15/322     Document Type: Article
Times cited : (4)

References (29)
  • 14
    • 0014747389 scopus 로고
    • Review of bulk and process-induced defects in GaAs semiconductors
    • Jungbluth E D 1970 Review of bulk and process-induced defects in GaAs semiconductors Metall. Trans. 1 575-86
    • (1970) Metall. Trans. , vol.1 , pp. 575-586
    • Jungbluth, E.D.1
  • 15
    • 0014767520 scopus 로고
    • Scanned laser infrared microscope
    • Sherman B and Black J F 1970 Scanned laser infrared microscope Appl. Optics 9 802-9
    • (1970) Appl. Optics , vol.9 , pp. 802-809
    • Sherman, B.1    Black, J.F.2
  • 17
    • 0345159001 scopus 로고
    • Metal Trans Scanning laser infrared imagining of normally opaque pure InAs
    • Jungbluth E D 1975 Metal Trans Scanning laser infrared imagining of normally opaque pure InAs Technical GTE Report TR 71-151.7
    • (1975) Technical GTE Report TR 71-151.7
    • Jungbluth, E.D.1
  • 19
    • 0015672113 scopus 로고
    • Scanning laser infrared microscopy of doping inhomogeneities in InAs single crystals
    • Jungbluth E D and Black J F 1973 Scanning laser infrared microscopy of doping inhomogeneities in InAs single crystals Solid State Commun. 13 1099-105
    • (1973) Solid State Commun. , vol.13 , pp. 1099-1105
    • Jungbluth, E.D.1    Black, J.F.2
  • 20
    • 0344296643 scopus 로고
    • Microscopy apparatus US Patent 3013467
    • Minsky M 1957 Microscopy apparatus US Patent 3013467
    • (1957)
    • Minsky, M.1
  • 21
    • 0017710584 scopus 로고
    • Image formation in the scanning microscope
    • Sheppard C J R and Choudhury A 1977 Image formation in the scanning microscope Opt. Acta 24 1051-73
    • (1977) Opt. Acta , vol.24 , pp. 1051-1073
    • Sheppard, C.J.R.1    Choudhury, A.2
  • 22
    • 0344296644 scopus 로고
    • Scanning confocal optical microscopy
    • McCarthy J J and Walker J S 1988 Scanning confocal optical microscopy EMSA Bulletin 18 75-9
    • (1988) EMSA Bulletin , vol.18 , pp. 75-79
    • McCarthy, J.J.1    Walker, J.S.2
  • 24
    • 0344296640 scopus 로고
    • Analysis of photoluminescence generated in a semi-infinite semiconductor slab by a time-varying focused laser beam
    • Wilson T and Pester P D 1988 Analysis of photoluminescence generated in a semi-infinite semiconductor slab by a time-varying focused laser beam J. Appl. Phys. 63 871-7
    • (1988) J. Appl. Phys. , vol.63 , pp. 871-877
    • Wilson, T.1    Pester, P.D.2
  • 29
    • 0041789432 scopus 로고
    • The influence of compensation on the temperature dependence of free carrier concentration in semiconductors
    • Anagnostopoulos A N 1990 The influence of compensation on the temperature dependence of free carrier concentration in semiconductors Physica B 162 133
    • (1990) Physica B , vol.162 , pp. 133
    • Anagnostopoulos, A.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.