Investigation of on-chip spiral inductors on a 0.6 μm BiCMOS technology for RF applications

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 18-24

  Power, J A ^a   Kelly, S C ^a   Griffith, E C ^a   O'Neill, M ^a  

^a Raheen Industrial Estate ^*  (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC LOSSES; INTEGRATED CIRCUIT LAYOUT;

ON-CHIP SPIRAL INDUCTORS;

ELECTRIC INDUCTORS;

EID: 0032636728     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)