Spontaneous fluctuation between symmetric and buckled dimer domains of Si(100) at 80 K

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 5 A, 1999, Pages 2904-2909

  Hata, Kenji ^a   Kimura, Tomohiko ^a   Sainoo, Yasuyuki ^a   Miyake, Koji ^a   Morita, Ryuji ^b   Yamashita, Mikio ^b   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

C defect; Dimers; Fluctuation; P defect; Si(100); STM

Indexed keywords

CRYSTAL DEFECTS; SCANNING TUNNELING MICROSCOPY;

BUCKLED DIMERS; SYMMETRIC DIMERS;

SILICON WAFERS;

EID: 0032636084     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.2904     Document Type: Article

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