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Volumn 142, Issue 1, 1999, Pages 381-385
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Heteroepitaxy of 3C-SiC using triode plasma enhanced chemical vapor deposition on Si substrates without buffer layer
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
FILM GROWTH;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING SILICON;
SILICON CARBIDE;
SURFACES;
X RAY DIFFRACTION ANALYSIS;
HETEROEPITAXY;
HYDROGEN TERMINATED SILICON;
EPITAXIAL GROWTH;
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EID: 0032635502
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00718-1 Document Type: Article |
Times cited : (6)
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References (10)
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