Substrate resistance effect on the Fmax parameter of isolated BJT in BiCMOS process

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 24-29

  Gloria, D ^a   Perrotin, A ^a   Carbonero, J L ^a   Morin, G ^a  

^a STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; MICROWAVES;

HIGH FREQUENCY TEST STRUCTURES; MICROWAVE DESIGN SYSTEMS (MDS);

BIPOLAR TRANSISTORS;

EID: 0032634204     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)