Experimental study of microstructure and critical current density of YBCO/Ag thick films under silver addition and electron irradiation

Superconductor Science and Technology

Volumn 12, Issue 5, 1999, Pages 264-269

  Rangel, R ^a,f   Galvan D H ^b   Hirata, G A ^b   Adem, E ^c   Morales, F ^d   Maple, M B ^e  

^a CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

^b CENTRO DE CIENCIAS DE LA MATERIA CONDENSADA   (Mexico)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^d INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

^e Inst for Pure and Appl Phys Sci   (United States)

^f UNIVERSIDAD MICHOACANA DE SAN NICOLÁS DE HIDALGO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DOPING (ADDITIVES); ELECTRON IRRADIATION; GRAIN BOUNDARIES; OXIDE SUPERCONDUCTORS; PHOTOELECTRON SPECTROSCOPY; POLYCRYSTALLINE MATERIALS; SILVER; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY CRYSTALLOGRAPHY; YTTRIUM BARIUM COPPER OXIDES;

FLUX PINNING; ZERO RESISTANCE TEMPERATURE;

SUPERCONDUCTING FILMS;

EID: 0032633876     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/5/005     Document Type: Article

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