On the mathematical structure of thin film equations containing a critical point

Chemical Engineering Science

Volumn 54, Issue 8, 1999, Pages 977-985

  Weinstein, Steven J ^a   Ruschak, Kenneth J ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

Critical point; Dip coating; Internal boundary condition; Thin film; Waves

Indexed keywords

BOUNDARY CONDITIONS; FLOW FIELD; LIQUID FILM; MATHEMATICAL ANALYSIS; WAVE;

CRITICAL POINT; DIP COATING; INTERNAL BOUNDARY CONDITIONS;

BOUNDARY CONDITIONS; COATING TECHNIQUES; SUBSTRATES; WAVE TRANSMISSION;

THIN FILMS;

EID: 0032633529     PISSN: 00092509     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2509(98)00447-3     Document Type: Article

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