Method of metal-insulator-semiconductor structure interface analysis

Surface and Interface Analysis

Volumn 28, Issue 1, 1999, Pages 142-145

  Bondarenko, G G ^a   Andreev, V V ^b   Loskutov, S A ^b   Stolyarov, A A ^b  

^a NATIONAL RESEARCH UNIVERSITY HIGHER SCHOOL OF ECONOMICS   (Russian Federation)

^b BAUMAN MOSCOW STATE TECHNICAL UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; INTERFACES (MATERIALS); SEMICONDUCTOR DEVICE STRUCTURES;

CHARGE INJECTION; INTERFACE ANALYSIS;

MIS DEVICES;

EID: 0032632891     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199908)28:1<142::aid-sia593>3.0.co;2-1     Document Type: Article

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