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Volumn 342, Issue 1, 1999, Pages 136-141
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Electrical and gated photoluminescence intensity studies on Schottky and oxidized Schottky structures
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
OXIDATION;
PHOTOLUMINESCENCE;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR JUNCTIONS;
INTERFACIAL OXIDES;
SCHOTTKY BARRIER DIODES;
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EID: 0032632667
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(98)01455-2 Document Type: Article |
Times cited : (11)
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References (26)
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