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Volumn 342, Issue 1, 1999, Pages 136-141

Electrical and gated photoluminescence intensity studies on Schottky and oxidized Schottky structures

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; OXIDATION; PHOTOLUMINESCENCE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR JUNCTIONS;

EID: 0032632667     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01455-2     Document Type: Article
Times cited : (11)

References (26)
  • 1
    • 0003546026 scopus 로고
    • Metal Semiconductor Contact
    • Oxford: Clarendon
    • Rhoderick E.H., Williams R.H. Metal Semiconductor Contact. 2nd :1988;Clarendon, Oxford.
    • (1988) 2nd
    • Rhoderick, E.H.1    Williams, R.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.