X-ray absorption near edge structure and X-ray diffraction studies of new cubic CsVTeO5 and CsVTeO6 compounds

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 3 A, 1999, Pages 1506-1509

  Hong, Young Sik ^a   Darriet, Jacques ^a   Yoon, Joo Byoung ^b   Choy, Jin Ho ^b  

^a INST CHIM MATIERE COND BORDEAUX   (France)

^b Seoul National University   (South Korea)

Author keywords

CsTiAsO5; CsVTeO5; CsVTeO6; Pyrochlore; Vanadium; XANES

Indexed keywords

CESIUM COMPOUNDS; ELECTRON ENERGY LEVELS; OXYGEN; SYNTHESIS (CHEMICAL); TITANIUM; VANADIUM; X RAY DIFFRACTION ANALYSIS;

RIETVELD REFINEMENT; SOLID STATE REACTIONS; VALENCE STATE; X RAY ABSORPTION;

CRYSTAL STRUCTURE;

EID: 0032632369     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.1506     Document Type: Article

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