Advances in amorphous silicon uncooled IR systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3698, Issue , 1999, Pages 161-167

  Brady, J ^a   Schimert, T ^a   Ratcliff, D ^a   Gooch, R ^a   Ritchey, B ^a   McCardel, P ^a   Rachels, K ^a   Ropson, S ^a   Wand, M ^a   Weinstein, M ^a   Wynn, J ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BOLOMETERS; CAMERAS; IMAGE ANALYSIS; IMAGE QUALITY; INFRARED DETECTORS;

AMORPHOUS SILICON UNCOOLED INFRARED SYSTEMS;

INFRARED IMAGING;

EID: 0032632172     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (1)