XPS characterization of Bi and Mn collected on atom-trapping silica for AAS

Applied Spectroscopy

Volumn 53, Issue 4, 1999, Pages 479-482

  Suzer, S ^a   Ertas, N ^a   Ataman, O Y ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIZATION; ATOMS; BISMUTH; ELECTROCHEMISTRY; HOLE TRAPS; MANGANESE; REDUCTION; SILICA;

ATOM TRAPPING; ELECTROCHEMICAL REDUCTION POTENTIALS; MULTIPLET SPLITTING; VALENCE STATE DETERMINATION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032631793     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702991946776     Document Type: Article

References (16)