Reliability and degradation mechanisms of high power diode lasers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3626, Issue , 1999, Pages 217-221

  Jandeleit, Juergen ^a   Wiedmann, Nicolas ^a   Loosen, Peter ^a   Poprawe, Reinhart ^a  

^a FRAUNHOFER INSTITUTE FOR LASER TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; HEAT SINKS; OPTICAL MICROSCOPY; RELIABILITY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SERVICE LIFE;

HIGH POWER DIODE LASERS;

SEMICONDUCTOR LASERS;

EID: 0032631579     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.345432     Document Type: Conference Paper

References (6)