Measurement and analysis of compaction in fused silica

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3578, Issue , 1999, Pages 16-27

  Allan, Douglas C ^a   Smith, Charlene ^a   Borrelli, N F ^a  

^a Corning Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; COMPACTION; DENSIFICATION; ERROR ANALYSIS; FUSED SILICA; INTERFEROMETRY; IRRADIATION; LASER DAMAGE; MONTE CARLO METHODS; PHOTOELASTICITY; PHOTOLITHOGRAPHY; REFRACTIVE INDEX;

PHOTOLITHOGRAPHIC EXPOSURE OPTICS;

OPTICAL GLASS;

EID: 0032631157     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (28)