Advanced holographic nondestructive testing system for residual stress analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3687, Issue , 1999, Pages 73-81

  Kniazkov, Anatoli ^a   Onischenko, Yuri ^a   Dovgalenko, George ^a   Salamo, Gregory ^a  

^a UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; LAPTOP COMPUTERS; NONDESTRUCTIVE EXAMINATION; STRESS ANALYSIS;

DISPLACEMENT MEASUREMENT; PORTABLE STRESS MEASUREMENT;

HOLOGRAPHIC INTERFEROMETRY;

EID: 0032631106     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (2)