Simple method for the determination of optical parameters of inhomogeneous thin films

Thin Solid Films

Volumn 342, Issue 1, 1999, Pages 153-159

  De Caro, Liberato ^a   Ferrara, Maria Cristina ^a  

^a Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT SCATTERING; REFRACTIVE INDEX; SPECTRUM ANALYSIS; SUBSTRATES; THIN FILMS;

SPECTRAL PHOTOMETRIC ANALYSIS;

SEMICONDUCTING FILMS;

EID: 0032631007     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01483-7     Document Type: Article

References (11)

1. Rainer F., Lowdermilk W.H., Milan D., Carniglia C.K., Hart T.T., Lichtenstein T.L. Appl. Opt. 24:1985;496.
2. Targove J.D., Lehan J.P., Lingg L.J., Macleod H.A., Leavitt J.A., McIntyre L.C. Appl. Opt. 26:1987;3733.
3. Borgogno J.P., Lazarides B., Pelletier E. Appl. Opt. 21:1982;4020.
4. Swanepoel R. J. Phys. E: Sci. Instrum. 17:1984;896.
5. Piegari A., Emiliani G. Thin Solid films. 171:1989;243.
6. Bah K., Czapla A., Pisarkiewicz T. Thin Solid films. 232:1993;18.
7. Montecchi M., Masetti E., Emiliani G. Pure Appl. Opt. 4:1995;15.
8. Montecchi M. Pure Appl. Opt. 4:1995;831.
9. Bueno R.M., Trigo J.F., Martinez-Duart J.M., Elizalde E., Sanz J.M. J. Vac. Sci. Technol. A. 13:1995;2378.
10. Heavens O.S. Optical Properties of thin solid films. 1991;Dover, New York. p. 46.
11. Borgogno J.P., Flory F., Roche P., Schmitt B., Albrand G., Pelletier E., Macleod H.A. Appl.Opt. 23:1984;3567.