Thermodynamic noise model for nonlinear resistors

IEEE Electron Device Letters

Volumn 20, Issue 8, 1999, Pages 402-404

  Weiss, Laurens ^a   Mathis, Wolfgang ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CURRENT VOLTAGE CHARACTERISTICS; JUNCTION GATE FIELD EFFECT TRANSISTORS; MOSFET DEVICES; NYQUIST DIAGRAMS; SEMICONDUCTOR DEVICE MODELS; SHORT CIRCUIT CURRENTS; SHOT NOISE; THERMAL NOISE; TUNNEL JUNCTIONS; WHITE NOISE;

GAUSSIAN WHITE NOISE MODELS; LINEAR-QUADRATIC SHORT CIRCUIT NOISE CURRENTS; PASSIVE NONLINEAR RESISTORS;

RESISTORS;

EID: 0032630996     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.778157     Document Type: Article

References (15)

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