Bayesian approach to prediction of system failure rates by criticalities under event trees

International Journal of Production Economics

Volumn 60, Issue , 1999, Pages 623-628

  Jun, Chi Hyuck ^a   Chang, Soo Y ^a   Hong, Yushin ^a   Yang, Heejoong ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Chongju University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; FAILURE (MECHANICAL); POISSON DISTRIBUTION; PROBABILITY; PROBABILITY DENSITY FUNCTION; QUALITY CONTROL;

BACKUP SYSTEM; CRITICALITY LEVEL; EVENT TREE; FAILURE RATE; GAMMA PRIOR;

FAILURE ANALYSIS;

EID: 0032630851     PISSN: 09255273     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-5273(98)00135-2     Document Type: Article

References (7)

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