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Volumn 44, Issue 18, 1999, Pages 3203-3209

Testing and control issues in large area electrochromic films and devices

Author keywords

[No Author keywords available]

Indexed keywords

BLEACHING; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; THIN FILMS; TRANSIENTS;

EID: 0032630438     PISSN: 00134686     EISSN: None     Source Type: None    
DOI: 10.1016/S0013-4686(99)00038-9     Document Type: Article
Times cited : (16)

References (12)
  • 8
    • 0031289323 scopus 로고    scopus 로고
    • Simulation model for ion intercalation in electrochromic devices
    • Wang J., Bell J.M., Skryabin I.L. Simulation model for ion intercalation in electrochromic devices. Proc. SPIE. 3138:1997;20.
    • (1997) Proc. SPIE , vol.3138 , pp. 20
    • Wang, J.1    Bell, J.M.2    Skryabin, I.L.3
  • 10
    • 85031627161 scopus 로고    scopus 로고
    • Control of Electrochromic Windows, International Patent Application PCT/AU97/00697
    • I.L. Skryabin, J.M. Bell, Control of Electrochromic Windows, International Patent Application PCT/AU97/00697.
    • Skryabin, I.L.1    Bell, J.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.